The RCA cleaning is a standard process of
wafer cleaning steps which need to be
performed before high-temperature processing steps (oxidation, diffusion, CVD) of silicon
wafers in semiconductor manufacturing. Werner Kern
developed the basic procedure in 1965 while working for RCA,
the Radio Corporation of America. It involves the following chemical
processes performed in sequence:
1.
Removal of the organic contaminants (organic
clean + particle clean)
2.
Removal of thin oxide layer
(oxide strip, optional)
3.
Removal of metallic or ionic contamination (ionic clean)
The wafers are prepared by soaking them in
deionized water. If they are grossly contaminated (visible residues are present),
they may require a preliminary cleanup in Piranha solution. The wafers are thoroughly rinsed
with deionized water between each step.
Ideally, the steps below are carried
out by immersing the wafers in solutions prepared in fused silica or fused
quartz vessels (borosilicate glassware must not be used, as its impurities leach
out and cause contamination). Likewise it is recommended that the chemicals
used are electronic grade (or "solar grade") to avoid impurities that
will recontaminate the wafer.
Piranha
Many
different mixture ratios are commonly used, and all are called piranha. A
typical mixture is 3 parts of conc. H2SO4 and 1 part of 30% H2O2
solution; other protocols may use a
4:1 or even 7:1 mixture. A closely related mixture, sometimes called "base piranha", is a 3:1 mixture of NH4OH with
H2O2.
Note:-
Piranha solution must be prepared with great care. It is highly
corrosive and an extremely powerful oxidizer. Surfaces must be
reasonably clean and completely free of organic solvents from previous wash
steps before coming into contact with the solution. Piranha solution cleans by dissolving organic contaminants, and a large amount of contaminant will cause violent bubbling
and a release of gas that can cause an explosion.
RCA-1
The first step (called RCA-1) is performed with a solution
of (ratios may vary)
·
5 parts of deionized water (DI
water)
·
1 part of NH4OH, (27%
by weight)
·
1 part of aqueous H2O2 (hydrogen
peroxide, 30%)
at 75°C
typically for 10 minutes. This base-peroxide
mixture removes organic residues. Particles are also very effectively
removed, even insoluble particles, since RCA-1 modifies the surface and
particle zeta potentials and causes them to repel. This
treatment results in the formation of a thin SiO2 layer
(about 1 nm) on the silicon surface, along with a certain degree of metallic
contamination (notably Fe) that will be removed in subsequent steps.
HF and DI water rinse
This step (for bare silicon wafers) is a short
immersion in a 1% or 2% solution of aqueous HF (hydrofluoric acid) at
25 °C for about 15 seconds, in order to remove the thin oxide layer and
some fraction of ionic contaminants. If this step is performed without ultra-high
purity materials and ultra-clean containers, it can lead to recontamination
since the bare silicon surface is very reactive. In any case, the subsequent
step (RCA-2) dissolves and regrows the oxide layer.
This step is needed
almost after every chemical processing of Si wafers. In short this process may
be called as HF and DI water rinse.
RCA-2
This step
(called RCA-2) is performed with a solution of (ratios may vary)
·
6 parts of DI water
·
1 part of aqueous HCl (hydrochloric
acid, 37% by weight)
·
1 part of aqueous H2O2 (hydrogen
peroxide, 30%)
at 75°C,
typically for 10 minutes. This treatment effectively
removes the remaining traces of metallic (ionic) contaminants, some of which
were introduced in the RCA-1 cleaning step. It also leaves a thin passivating
layer on the wafer surface, which protects the surface from subsequent
contamination (bare exposed silicon is contaminated immediately).
Rinsing and Drying
This step is again followed by HF and DI water rinse in order to remove the thin SiO2
layer. After this the wafers are dried using a Drier
or a Nitrogen gun.